Abstract
A laser scanning technique has been developed and applied to map surface inhomogeneities in amorphous silicon (a-Si:H) solar cells. The method provides high-resolution spatial mapping of optical and electrical properties, revealing correlations between surface morphology and photovoltaic performance.
Key Results
Spatial variations in light absorption and photoluminescence intensity were correlated with local variations in fill factor and conversion efficiency. The technique enables identification of degraded regions and optimization of deposition parameters.